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Journal Articles

Time-resolved laser and ion microbeam studies of single event transients in high-speed optoelectronic devices

Laird, J. S.; Hirao, Toshio; Onoda, Shinobu; Wakasa, Takeshi; Yamakawa, Takeshi; Abe, Hiroshi; Kamiya, Tomihiro; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.125 - 129, 2004/10

no abstracts in English

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